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Datasheet Literature Number: ReleaseDate Model 237-ALG-2 Triaxial Cable
The Keithley Instruments Model 237-ALG-2 is a 6.6 ft (2 m) triaxial cable that is terminated with a three-slot male triaxial connector on one end and alligator clips on the other end.PA-298E Model 4288-2 Dual-Unit Rack-Mount Kit
The Model 4288-2 Dual Fixed Rack Mounting Kit includes all of the hardware necessary for side-by-side rack mounting of two instruments, including Series 2000, 2182A, Series 2300, Series 2500, 2700, 2701, 6220, 6221, 6485, 6487, 6514, or 6517B.PA-290D Model 6220 DC Current Source and Model 6221 AC and DC Current Source
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Manuals Manual Type Part Number: ReleaseDate Keithley Instruments Safety Precautions
Safety Precautions PAUser Manuals 071341102 Model 6220 DC Current Source Model 6221 AC and DC Current Source Reference Manual
User Manuals 622X-901-01C Model 6220 DC Current Source Model 6221 AC and DC Current Source User's Manual
Primary User 622X-900-01C
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Technical Documents Document Type ReleaseDate Supporting the Materials Research of the Future
Advances in materials science are driving the future of many industries where the electrical properties of materials can reveal previously unknown materials characteristics. This flyer highlights the Keithley instrumentation that is vital to helping …Fact Sheet Four Step Error Checker Poster
This printable poster offers insight into errors commonly made when measuring low voltage, low current, low resistance, high resistance, or voltage from a high resistance source. Learn what can cause these errors, and get tips on how to avoid them.Poster Keithley Low Level Measurements Handbook - 7th Edition
The Keithley Low Level Measurements Handbook is a reference and guide for anyone looking to perform sensitive DC electrical measurements. Scroll down to find the section you need, or download the entire book as a PDF above. Once you click on each of …Product Article SOLUTIONS FOR SCIENTIFIC AND ENGINEERING RESEARCH
Brochure Applications Guide - Techniques for Multi-Channel Testing and Data Acquisition
Fact Sheet E-Handbook to Understanding Electrical Test and Measurement
Introduction Welcome to Keithley's Guide to Understanding Electrical Test and Measurement. For over 60 years, Keithley testand measurement instruments have provided measurements ranging from the most basic to very complex. In all …Fact Sheet New Materials and Devices E-Guide
Brochure Making Precision Low Voltage and Low Resistance Measurements E-Handbook
Fact Sheet Optimizing Low-Current Measurements and Instruments
Characterizing devices at low current levels requires knowledge, skill, and the right test equipment. Even with all three, achieving accuracy at low current levels can be a challenge because the level of the current is often at or below the noise …Whitepaper Advances in Electrical Measurements for Nanotechnology
Rev 3.15.13Product Article Advances in Electrical Measurements for Nanotechnology E-Handbook
Rev 3.13Fact Sheet High Impedance Semiconductor Resistivity and Hall Effect Test Configurations
Brochure Low Current/ High Resistance Measurement Selector Guide
Low Current/ High Resistance Measurement Selector Guide - 2013 CatalogProduct Selector Guide Low Voltage/ Low Resistance Measurements
Product Selector Guide MODEL 6221 AC AND DC CURRENT SOURCE INSTRUMENT SPECIFICATION
MODEL 6221 AC AND DC CURRENT SOURCE INSTRUMENT SPECIFICATION REV CSpecification Hall Effect Measurements Essential for Characterizing High Carrier Mobility
The Hall effect can be observed when the combination of a magnetic field through a sample and a current along the length of the sample create an electrical current perpendicular to both the magnetic field and the current, which in turn …Technical Article Hall Effect Measurements in Materials Characterization
Hall effect measurements have been valuable tools for material characterization since Edwin Hall discovered the phenomenon in 1879. Essentially, the Hall effect can be observed when the combination of a magnetic field …Whitepaper Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
Brochure Guide to Measuring New Materials and Devices
Product Article Pulse Testing for Nanoscale Devices
Technical Article New dG Measurement Methods Reveal Nanodevice Characteristics Faster, at Lower Cost
Technical Article AC Versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices
AC versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices Sensitive Measurement Needs Researchers today must measure mate-rial and device characteristics that involve very small currents and voltages. …Technical Article The Emerging Challenges of Nanotechnology Testing
Nanotechnology is an important new area of research that promises significant advances in electronics, materials, biotechnology, alternative energy sources, and dozens of other applications. …Technical Article #2615 Determining Resistivity and Conductivity Type using a Four-Point Collinear Probe and the Model 6221 Current Source
Application Note Characterizing Nanoscale Devices with Differential Conductive Measurements
As modern electronics continue to shrink, researchers increasingly look to nanotechnology for breakthroughs in device size and power consumption. In these nanoscale devices, electrical characteristics are affected by quantum behavior …Technical Article New Instruments Can Lock Out Lock-ins
Whitepaper Low-Voltage Measurement Techniques
Introduction Electronics are continuing to shrink as consumers demand faster, more feature-rich products in ever-smaller form factors. Because of their small sizes, these electronic components usually have limited power handling …Technical Article Electrical Measurements on Nanoscale Materials
This tutorial explains the importance of electrical measurements to the science of nanotechnology, and presents practical considerations in making these measurements. Topics include material and structural characteristics that can be …Technical Article #2611 Low-Level Pulsed Electrical Characterization with the Model 6221/2182A Combination
Application Note An Improved Method for Differential Conductance Measurements
Introduction As modern electronics continue to shrink, researchers are increasingly looking to nano technology as the basis for the next breakthrough in device size and power consumption. Indeed, as semiconductor structures …Whitepaper Models 6220 Current Source Specifications Rev. B
Model 6220 Programmable Current Source Specifications Rev. BSpecification Precision, Low Current Sources for Device Testing and Characterization
High accuracy, low noise sourcing combined with exceptional ease of use Keithley's new Model 6220 DC Current Source and Model 6221 AC and DC Current Source deliver the high resolution, low noise, low current sourcing you need …Brochure Unraveling Fuel Cell Electrical Measurements
Technical Article Problem: Reading Drift in Low Resistance Measurements
Technical Article Problem: Noisy Readings in Low Resistance Measurements
Technical Article Problem: Noisy Readings in High Resistance Measurements
Technical Article Problem: Errors in Low Resistance Measurements
Technical Article Problem: Error in Low Voltage, Low Current Measurements
Technical Article Achieving Accurate and Reliable Resistance Measurements in Low Power and Low Voltage Applications
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Software Document Type Part Number: ReleaseDate Keithley I/O Layer version C10 (Windows 11, 10, 8, 7 Compatible)
Keithley I/O Layer version C10 (KIOL-850C10 adds support for Windows 10 and 11 Operating Systems and installs NI-VISA Runtime 17.5 and NI-ICP 17.0. This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL …Application KIOL-850C10 6220/6221 Firmware Revision D04
Model 6220/6221 D04 Firmware Release.DO NOT install revision D firmware on instruments with revision A firmware.Firmware 6221-801D04 Keithley I/O Layer - version C07 (Windows 8, 7, Vista, and XP Compatible)
Keithley I/O Layer version C07 (KIOL-850C07 adds a change to only send the :syst:rem command to RS-232 connections This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL-850C05, KIOL-850C06). This version …Application KIOL-850C07 6220/6221 Firmware Revision D03
6220/6221 D03 Firmware Installation Package (READ RELEASE NOTES FIRST)Firmware 6221-801D03 Install v2.7 of the Free Example Software for the Models 6220/6221. (UNSUPPORTED)
Install v2.7 of the Free Example Software for the Models 6220/6221.Application 6220-EXMPL-2.7 6220/6221 IVI Driver for Visual Basic (VB), VC/C++, Labview (LV) and LabWindows CVI, Rev. B01.1 (6.4Mb) - Requires Installation of Keithley I/O Layer (KIOL-850)
6220/1 IVI Driver Rev. B01.1Driver 622X-855B011 6220/6221 Firmware Revision A05
6220/6221 A05 Firmware Installation PackageFirmware 6221-801A05 622x Native LabView 2009 Driver version 1.0.0 - Project Style
6220 & 6221 Native LabView 2009 Driver version 1.0.0 - project style.Driver 622X-LV-1.0.0 6220/6221 Firmware revision A04
6220/6221 Firmware revision A04Firmware 6221-801A04
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FAQS FAQ ID How to configure the Model 6220/6221 and 2182A for Delta Mode?
The Keithley Models 6220 and 6221 Current Sources are designed to work with the Model 2182A Nanovoltmeter to measure very low resistances. A good method of doing this is called the Delta Method as described in the Keithley Low Level Measurements …783018 How can I measure hall mobility of 2D materials?
Hall mobility, or electron mobility, of a 2D material is best measured by utilizing the Hall effect. There are several different Keithley solutions for making Hall effect measurements. A Keithley 4200A-SCS Parameter Analyzer with 4 Source Measure …71221
